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Spektrofotometre X-8200 Serisi Peak Instruments

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Peak Instruments X-8200 Series Visible Region Spectrophotometer

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Dual beam, xenon lamp visible region spectrophotometer. Available in 6 models with silicon button or touchscreen options; delivers rapid and stable measurement performance for laboratory applications.

190-1100nm wavelength range with dual beam optical system
Xenon lamp source and solid-state silicon photodiode detector
Photometric accuracy %0.2T, wavelength accuracy ±0.3nm
7-inch TFT display; silicon button (standard) or touchscreen interface (T series)
USB, USB HOST, and RS232C data output options
6 model variations to accommodate different slit width requirements (2nm / 1nm / 0.5-5nm variable)

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Daha fazla detay

The X-8200 Series is a dual beam visible region spectrophotometer operating in the 190-1100nm wavelength range. It delivers stable and repeatable measurements through a xenon lamp source and solid-state silicon photodiode detector. Designed for users seeking a reliable solution for routine laboratory analysis (transmittance, absorbance, and concentration measurement).

The series comprises six models: X-8200, X-8200S, X-8200A, X-8200T, X-8200TS, and X-8200TA. Standard models feature a 2nm slit width, the S series offers 1nm, while the A series provides variable slit width between 0.5-5nm. Models with 'T' designation feature touchscreen control; others use silicon button interface. All models are equipped with a 7-inch TFT display, Cortex_M3 120MHz processor, and 1200 lines/mm holographic grating.

The instrument supports data transfer via USB, connects to computers or printers via RS232C serial connection. Photometric accuracy is %0.2T and wavelength accuracy is ±0.3nm; these specifications make it suitable for educational, quality control, and general analytical laboratory applications.

Technical Specifications

Wavelength Range	190-1100nm
Optical System	Dual Beam, Holographic Grating 1200 lines/mm
Slit Width	X-8200/T: 2nm, S series: 1nm, A series: 0.5-5nm variable
Wavelength Accuracy	±0.3nm
Wavelength Repeatability	≤0.1nm
Photometric Accuracy	%0.2T (%0-100T), ±0.002A (0-0.5A), ±0.004A (0.5-1A)
Photometric Repeatability	≤%0.15T, ±0.001A (0-0.5A), ±0.002A (0.5-1A)
Stray Light	≤%0.03T @220nm, 360nm
Stability	±0.001A/hour @500nm
Photometric Range	%0-200T, -0.3-3.0A, 0-9999C
Detector	Solid-State Silicon Photodiode
Light Source	Xenon Lamp
Processor	Cortex_M3, 120MHz
Data Output	RS232C, USB Driver, USB HOST
Operating Modes	T, A, C, E
Power Requirement	AC 110-220V, 50-60Hz
Display	7-inch TFT (silicon button or touchscreen)
Shipping Dimensions/Weight	790x660x370mm, 29kg

Applications

Water and wastewater analysis for concentration and absorbance measurement
Food and beverage quality control laboratories
Routine UV-Vis measurement in pharmaceutical and chemical analysis
Fundamental spectrophotometric work in educational and research laboratories

Frequently Asked Questions

How do the X-8200 series models differ from each other?

Differences lie in display control (silicon button or touchscreen interface; T-series models feature touchscreen) and slit width options (standard 2nm, S series 1nm, A series 0.5-5nm variable).

Can the instrument operate without a computer?

Yes, the 7-inch TFT display enables viewing of scan curves and graphics without computer connectivity.

How are data exported?

Data can be exported via USB storage in Excel, txt, and image formats; alternatively, RS232C connection enables data transfer to a computer or printer.